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铁道科学与工程学报

JOURNAL OF RAILWAY SCIENCE AND ENGINEERING

Vol. 19    Special 3    December 2009

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Study of thermal expansion of mercury indium telluride crystals by XRD technique
WANG Ling-hang (王领航)1, JIE Wan-qi(介万奇)2

1. Electronic Materials Research Laboratory, Key Laboratory of Education Ministry,
Xi’an Jiaotong University, Xi’an 710049, China;
2. State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi’an 710072, China

Abstract:The thermal expansion behavior of mercury indium telluride (MIT) crystals, Hg(33x)In2xTe3(x=0.5), based on X-ray diffraction experimental data is studied at 298−573 K. The variation of the lattice parameter of MIT crystals with temperature was determined and the thermal expansion coefficient was deduced to be 6.18×10−6 K−1. The results of the thermal expansion are fitted to polynomial expressions. It is found that the lattice parameter decreases quickly with temperature increasing at 298−330 K and then increases continuously up to 573 K. The minimum lattice parameter corresponds to a maximum shrinkage of 0.06%.

 

Key words: mercury indium telluride; crystal growth; XRD; thermal expansion; semiconductor material

ISSN 1672-7029
CN 43-1423/U

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