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铁道科学与工程学报

JOURNAL OF RAILWAY SCIENCE AND ENGINEERING

Vol. 5    No. 3    September 1995

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MICROSTRUCTURES AND OPTICAL PROPERTIES OF Te81Ge15Sb4 THIN FILMS USED FOR PHASE CHANGE RECORDING MATERIALS
Song Lianpeng1; Huang Shuwan2

1.Department of Materials Science and Engineering; Central South University of Technology; Changsha 410083;
2.Department of Materials Science and Engineering; University of Electronic Science and Technology of China; Chengdu 610054

Abstract:Amorphous Te81Ge15Sb4 thin films have been prepared by meltquenching then vacuum evaporation technique. The differences of microstructures and optical properties of  Te81Ge15Sb4 films between the amorphous and the crystalline states have been studied. The results show that this material is a hopeful storage medium for short-wave laser, and can improve recording density.

 

Key words: Te81Ge15Sb4; storage medium; optical properties

ISSN 1672-7029
CN 43-1423/U

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